Telcordia software to calculate the reliability prediction of electronic equipment based on the Telcordia (Bellcore) TR and SR standards. Free trial. Telcordia Telecom Information SuperStore – Reliability Prediction Procedure for The following documents were fully or partly replaced by SR TR Bellcore TR – Download as PDF File .pdf), Text File .txt) or read online.

Author: Fegar Zugis
Country: Haiti
Language: English (Spanish)
Genre: Science
Published (Last): 23 December 2013
Pages: 140
PDF File Size: 20.48 Mb
ePub File Size: 14.26 Mb
ISBN: 251-2-77141-476-8
Downloads: 28220
Price: Free* [*Free Regsitration Required]
Uploader: Tom

View Table of Contents Payment Processing. Issue 4 beolcore SR provides the only hardware reliability prediction procedure developed from the input and participation of a cross-section of major industrial companies.

This procedure also documents a recommended method for predicting serial system hardware reliability.

Bellcore/Telcordia Reliability Prediction in Lambda Predict

According to different physics of failure mechanisms, one more term i. The activation energy is usually related to certain failure mechanisms and failure modes, and can be determined by correlating thermal cycling test data and the Coffin-Manson model.

Time plot and the calculated B10 life for the analysis. Since the parts may not operate under the reference conditions, the real operating conditions will result in failure rates that are different from those given by the “parts count” method. Screen shots click to enlarge. The Turnover Point,” Proc. Rt-332 leads to the concept of reliability prediction.

These techniques estimate the mean failure rate in FITs for electronic equipment.


FAQ: What is Telcordia (Bellcore) SR?

Black developed an empirical model to estimate the MTTF of a wire, taking electromigration into consideration, which is now generally known as the Black model. In physics of failure approaches, the model parameters can be determined from design specs or from test data. On Reliabilityvol. These methods tend to present good estimates of reliability for similar or slightly modified parts.

Notice 1 bellcorf and Notice 2 in These predictions provide necessary input to system-level reliability models for predicting expected downtime per year and system availability. Several models are similar to the standard Eyring model.

Predictions based on field data The Trr-332 standard also documents a recommended method for predicting serial system hardware reliability. For example, for the Weibull distribution, the life characteristic is the scale brllcore eta and for the lognormal distribution, it is the log mean.

Revised generic device failure rates in Section 8, based mainly on new data for many components. The empirical or standards based methods can be used in the design stage to quickly obtain a rough estimation of product reliability. Clarification and guidance on items raised by forum participants and by frequently asked questions from users.

Hot carrier injection describes the phenomena observed in MOSFETs by which the carrier gains sufficient energy to be injected into the gate oxide, generate interface or bulk oxide defects and degrade MOSFETs characteristics such as threshold voltage, transconductance, etc. In today’s competitive electronic products market, having higher reliability than competitors is one of the key factors for success.


Method II is based on combining Method I predictions with data from laboratory tests performed in accordance with specific SR criteria. This is because the empirical and physics of failure methods calculate the system failure rate based on the predictions for the components e. Figure 4 shows the data and calculated parameters.

Bellcore/Telcordia Predictions

Method III is a statistical prediction of failure rate based on field tracking data collected in accordance with specific SR criteria. The Black model employs external heating and increased current density and is given by:.

There are reasons for this variation. The failure rate for parts under specific operating conditions can be calculated as:. This empirically based model is known as the Arrhenius equation. This approach is based upon an understanding of the physical properties of the materials, operation processes and technologies used in the design.

Figure 5 shows the reliability plot and the estimated B10 life at the usage temperature level. Time plot and calculated B10 life for the analysis. Click to Request Price Quote. Among these approaches, three main categories are often used within government and industry: This model takes the form [9]:.